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LCR Meter

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NF

모델

ZM2371

가격

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ZM2371
ZM2372
ZM2376
Measurement parameters

Primary parameters? |Z|, |Y|, L, C, R, G
Secondary parameters? Q, D, θ, X, B, Rs, Rp, G, Lp, Rdc

Measurement frequency1 mHz to 100 kHz 
1 mHz to 5.5 MHz

Basic accuracy

0.08 %

Measurement signal level

10 mVrms to 5 Vrms, 1μArms to 200 mArms
DC biasInternal: 0 to +2.5 V
External: ± 40V ( using an optional DC bias voltage adapter)
Internal: 0 to +5.0 V
External: ± 40V ( using an optional DC bias voltage adapter)
Measurement timeMax. 2 ms (at 1 kHz)Max. 2 ms (at 1 MHz)
Contact checkUnequippedEquipped (4 terminal)Equipped
Low capacitance checkUnequippedUnequippedEquipped
Comparator9 bins14 bins14 bins
Multi-measurementUnequippedUnequippedEquipped
InterfaceUSB, RS-232
*GPIB interface is not available. 
USB, RS-232, GPIBUSB, RS-232, GPIB, 
LAN (option)
Handler interfaceUnequipped

Equipped

Equipped
SoftwareApplication software for remote control and data acquisition

 

 

  • Basic accuracy: 0.08 %, display resolution of 6 digits (max.)
  • Measurement speed: Max. 2 ms at 1 kHz
    Measurement speed is selectable between 5 levels: RAP (rapid) , FAST, MED, SLOW and VSLO (very slow). When set to RAP, high-speed measurement at 2 ms (1kHz) or 10ms (120 Hz) can be performed.
  • Measurement frequency: 1 mHz to 100 kHz, 5-digit resolution
  • Measurement signal level: Max. 5 Vrms, 3-digit resolution
  • Measurements parameters: Lp, Ls, Cp, Cs, Rp, Rs, |Z|, |Y|, G, Q, D, theta, X, B, Rdc
  • Internal DC bias: 0 V to +2.50 V
  • Constant-voltage/constant-current drive (ALC:Auto Level Control)
  • DC resistance measurement
  • 4-terminal contact check function and a handler interface for production lines (ZM2372)
    ZM2372 is equipped with contact check function to prevent mis-measurement or incorrect sorting due to defective contact between the measurement tip and component. It checks contact with 4 measurement terminals, and if a contact defect occurs, it halts measurement/sorting and determines the contact defect. This function contributes to improved yield.
     

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