• 3 basic semiconductor measurements: I, I-V and quasi-static C-V
• Two programmable voltage sources
• High resolution: 0.001 x 10^-12 A
• HP-IB standard

Component Measurement instrumentation.  It consists of an extremely stable picoampere meter and two programmable dc voltage sources, one of which operates as a ramp and staircase generator as well as a dc source.

• Stable pA Measurements
  * maximum resolution of 10^-15 A
  * low noise test leads, and an electrostatic and light shielded test fixture
• Synchronized I-V Measurements
  * precise, programmable timing capability, we can now make fast, accurate I-V and C-V measurements
• Quasi-Static C-V Measurements
  * automatic quasi-static C-V measurements are easily accomplished by the ramp voltage capability
• HP-IB Capability

Specifications:

• Measurement Functions: I, I-V and C-V
• Voltage Sources: two separate sources (V_A and V_B)
  V_A: ± 100V programmable source/function generator
  V_B: ± 100V programmable dc voltage source

Measurement Function/Source Selection

• Function: I, I-V, C-V
• Voltage sweep: auto or manual (pause)

Current Measurements

• Displays: current, 3½ digits with 2 character annunciator.  Voltage, 3½ digits
• Measurement range: ±0.001 x 10^-12 A to 1.000 x 10^-2 A full scale in 11 ranges
• Overrange capability: 99.9% on all ranges
• Range selection: auto (lowest current range is selectable) and manual
• Zero Offset: cancels leakage current of test leads or test fixtures
• Offset range: 0 to ± 100 x 10^-15 A
• Trigger: INT, EXT and HOLD/MAN
• Input terminal: triaxial

Capacitance-Voltage (C-V) Measurement

• Measurement ranges: 0.0 pF - 100.0 pF and 200 pF - 1000 pF full scale in two ranges; 99.9% overrange
• Ranging: auto
• % C: capacitance change of device under test is displayed as a percent of the set value of the oxide capacitance (Cox = 100%)
• %C range: 0.0% - 199.9%
• Cox setting ranges (2 ranges): 0.1 pF - 199.9 pF and 200 pF - 1999 pF
• Zero offset: cancels stray capacitance of test fixtures and test leads
• Offset range: 0 to 100 pF
• High speed I data output: available with HP-IB interface only.  Outputs current measurement data at 4 ms intervals (max rate)

DC Voltage Sources

• Output Modes, V_A and V_B
  V_A: Ramp up, Ramp up/down, Staircase up, Staircase up/down, dc
  V_B: dc
• Voltage ranges (V_A and V_B): 0 to ± 10.00V and 0 to ± 100.0V in 2 ranges, auto range only
• Maximum current: 10 mA, both sources
• Voltage sweep: auto and manual (pause), up/down step in manual (pause) mode.   Sweep abort standard

Operating Parameter Setting Ranges

• Start voltage and stop voltage: 0 - ± 10.00V, 0.01V steps; 0 - ± 100.0V, 0.1V steps
• Step voltage: 0 - ± 10.00V, 0.01V steps; 0 - ± 100.0V, 0.1V steps
• Hold time: 0 - 199.9 seconds in 0.1s increments; 0 - 1999 seconds in 1.0s increments
• Step delay time: 0 - 10.00 seconds in 0.01s increments; 0 - 100.0 seconds in 0.1 increments
• Ramp rate (dV/dt): 0.001 V/s - 1.000 V/s in 0.001 V/s increments

Current Measurement

• Range: 10^-2 - 10^-8, 10^-9, 10^-10, 10^-11, 10^-12

Analog Output I, C and V_A

• Low pass filter: 3 position: OFF, 0.22s ± 20% and 1s ± 20% applied to both V_A and I/C data outputs
• Pen lift output
• Recorder output scaling: push button scaling of lower left and upper right limits of X-Y recorder

Accessories Furnished

• HP 16053A test leads: consists of one triaxial cable, two each BNC-BNC cables
• HP 16055A test fixture: for general device measurements.  Provides electrostatic and light shielding for stable pA measurements