Intuitive, point-and-click Windows®-based environment

Unique Remote PreAmps extend the resolution of SMUs to 0.1fA

C-V instrument makes C-V measurements as easy as DC I-V

Pulse and pulse I-V capabilities for advanced semiconductor testing

Scope card provides integrated scope and pulse measure functionality

Self-contained PC provides fast test setup, powerful data analysis, graphing and

     printing, and on-board mass storage of test results

Unique browser-style Project Navigator organizes tests by device type, allows

     access to multiple tests, and provides test sequencing and looping control

Built-in stress/measure, looping, and data analysis for point-and-click reliability

     testing, including five JEDEC compliant sample tests

Integrated support for a variety of LCR meters, Keithley switch matrix

     configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators

Includes software drivers for leading analytical probers